Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Nonvolatile charge storage characteristics of a MOS diode with buried silicon nanocrystals and interfacial Si nano-pyramids
Details
Nonvolatile charge storage characteristics of a MOS diode with buried silicon nanocrystals and interfacial Si nano-pyramids
Journal
Materials Research Society Symposium
Journal Volume
1145
Pages
14-20
Date Issued
2008
Author(s)
Lien, Y.-C.
Pai, Y.-H.
Lin, C.-T.
GONG-RU LIN
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-77952184760&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/340875
Type
conference paper