Test generation of path delay faults induced by defects in power TSV

Journal

Proceedings of the Asian Test Symposium

Pages

43-48

Date Issued

2013

Author(s)

Shih, C.-J.

Hsieh, S.-A.

Lu, Y.-C.

Li, J.C.-M.

Wu, T.-L.

DOI

10.1109/ATS.2013.18

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/498068

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84893436993&doi=10.1109%2fATS.2013.18&partnerID=40&md5=f1f5f24206fe6aa814ff1027e3880c77

Type

conference paper