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College of Management / 管理學院
Business Administration / 工商管理學系暨商學研究所
An Integrated Fault Detection Scheme for Wafer Acceptance Test Data
Details
An Integrated Fault Detection Scheme for Wafer Acceptance Test Data
Journal
International Symposium on Semiconductor Manufacturing
Date Issued
1998-10
Author(s)
RUEY-SHAN GUO
S. Chang
C. Fan
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/343377
Type
conference paper
