Test Methodology for Dual-rail Asynchronous Circuits

Journal

Proceedings - Design Automation Conference

Journal Volume

Part 128280

Date Issued

2017

Author(s)

Huang, K.-Y.

Shen, T.-Y.

DOI

10.1145/3061639.3062325

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505989

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85023640285&doi=10.1145%2f3061639.3062325&partnerID=40&md5=2dfe9b35011a120a5a6f5756f6cfbeb6

Type

conference paper