RF Built-in-self-test techniques for 5GHz wireless SOC (I)

While it is so common in digital
circuits, built-in-self-test (BIST) is not
mature in RF circuits’ domain. In order to
find the possibility to implement BIST in
RF circuits, our first year research among
the three project includes：1. The analysis
of RF amplifier BIST methods. 2. The
system-in-package components are
developed for the future system self test,
which have been published in several
international conference papers. 3. The
RF boundary scan cell (BSC) to control
RF-BIST function is developed and
integrated with RF circuits, which has been
submitted to U.S. patent.