Modeling dislocation-related leakage currents in GaN p-n diodes

Journal

Journal of Applied Physics

Journal Volume

126

Journal Issue

24

Date Issued

2019

Author(s)

Robertson, C.A.

Qwah, K.S.

Wu, Y.-R.

Speck, J.S.

DOI

10.1063/1.5123394

URI

https://www.scopus.com/inward/record.url?eid=2-s2.0-85077759752&partnerID=40&md5=d2995185b9fefc8e943274af6ccbea26

https://scholars.lib.ntu.edu.tw/handle/123456789/559388

Type

journal article