Attainment of low interfacial trap density absent of a large midgap peak in In0.2Ga0.8 As by Ga2O3(Gd 2O3) passivation
Journal
Applied Physics Letters
Journal Volume
98
Journal Issue
6
Date Issued
2011
Author(s)
Lin, C.A.
Chiu, H.C.
Chiang, T.H.
Lin, T.D.
Chang, Y.H.
Chang, W.H.
Chang, Y.C.
Wang, W.-E.
Dekoster, J.
Hoffmann, T.Y.
Kow, J.
Type
journal article