High-gain InAlAs/InGaAs npn single heterojunction bipolar transistors grown by molecular beam epitaxy
Resource
Indium Phosphide and Related Materials, 1992., Fourth International Conference on
Journal
Fourth International Conference on Indium Phosphide and Related Materials
Pages
-
Date Issued
1992-04
Date
1992-04
Author(s)
Huang, Chao-Hsing
DOI
N/A
Abstract
The growth, fabrication, and characteristics of InAlAs/InGaAs heterojunction bipolar transistors (HBTs) are demonstrated. The effect of lattice-mismatch on the device characteristics is first studied. It is found that the tolerance of lattice mismatch is 4*10/sup -3/. The abnormal non-1kT collector current and non-2kT base current due to the bias-dependent heterojunction spike are also discussed. The I-V characteristics of abrupt and graded HBTs are compared. It is found that the abrupt HBT has smaller output resistance and breakdown voltage. These results are due to the hot electron launching from the potential spike of the abrupt junction. However, the abrupt HBT shows higher current gain, which is as high as 10000. >
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Type
journal article
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