Velocity overshoot effects and scaling issues in III-V nitrides

Journal

IEEE Transactions on Electron Devices

Journal Volume

52

Journal Issue

3

Pages

311-316

Date Issued

2005

Author(s)

Singh, M

Wu, YR

Singh, JP

DOI

10.1109/TED.2005.843966

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/314244

Type

journal article