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  4. Negative Air Ion Technology for Control of VOCs Emission from Semiconductor Industry
 
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Negative Air Ion Technology for Control of VOCs Emission from Semiconductor Industry

Date Issued
2004-07-31
Date
2004-07-31
Author(s)
李慧梅  
DOI
922211E002024
URI
http://ntur.lib.ntu.edu.tw//handle/246246/22131
Abstract
Although negative air ionizers have been used in air cleaning, little study have been done on removal of volatile organiccompounds (VOCs) by negative air ions (NAI). This study investigated the reactions of NAI and VOCs in a batch reactor. Three species of VOCs - chloroform, toluene and 1,5-hexadiene - were selected to react with NAI at relative humidity of 0, 25 and 70%. The NAI was generated by a negative electric discharge at 15.0 kV. The reaction chamber was designed as a dark discharge to prevent the generation of O3 and NOx. The NAI concentrations were 1.34×106 to 1.24×106 ion cm-3 at relative humidities between 0 and 70%. The results indicate that the order of the reactions of chloroform and toluene with NAI was zero, and 0.433 order for 1,5-hexadiene. The reaction rate constants of chloroform, toluene and 1,5-hexadiene were 1.74 − 3.07 ppb min-1, 1.07 − 2.66 ppb min-1 and 0.463 − 0.478 ppb0.567 min-1 at relative humidity from 0 to 70%. The effect of relative humidity on the reaction kinetics was obvious for chloroform and toluene but not for 1,5-hexadiene. The reaction between 1,5-hexa- diene and NAI generated a relatively stable intermediate species, 4-pentenal. The oxidation of chloroform, toluene and 1,5-hexadiene by NAI proceeded slowly.
Subjects
Negative air ion
Semiconductor
industry
VOCs
Publisher
臺北市:國立臺灣大學環境工程學研究所
Type
report
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