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High Speed Serial Transmission Media Testing
Date Issued
2005
Date
2005
Author(s)
Yang, Bo-An
DOI
en-US
Abstract
Due to the limitation of clock skew, parallel communication has reached the bottleneck in terms of data transmission. As a result, parallel communication is gradually being replaced by high-speed serial communication.
TDR is effective fault diagnosis instrument for cable testing. However, it is not economical to identify whether the product is pass or fail in manufacturing testing. We proposed an economical testing technique to identify pass/fail of high speed transmission media.
To reduce the complexity of testing system, the relationship model of incident signal and reflective signal is build according to frequent fault characteristics and time domain reflectometry theorem. The requirement of high-speed devices is lower because high frequency signals can be sampled by low frequency using coherent under-sampling method. The testing cost has been reduced because the requirement of high-speed devices is lower.
TDR is effective fault diagnosis instrument for cable testing. However, it is not economical to identify whether the product is pass or fail in manufacturing testing. We proposed an economical testing technique to identify pass/fail of high speed transmission media.
To reduce the complexity of testing system, the relationship model of incident signal and reflective signal is build according to frequent fault characteristics and time domain reflectometry theorem. The requirement of high-speed devices is lower because high frequency signals can be sampled by low frequency using coherent under-sampling method. The testing cost has been reduced because the requirement of high-speed devices is lower.
Subjects
類比電路測試
serial transmission media
Type
thesis
File(s)
No Thumbnail Available
Name
ntu-94-R91943086-1.pdf
Size
23.31 KB
Format
Adobe PDF
Checksum
(MD5):bc336315aa916c090ffc188011591c05