Theoretical Comparison of Electron Energy-Loss and X-ray Absorption Near-Edge Fine Structure of SiL2,3 Edge

Resource

Journal of Applied Physics, v.68, p.288

Journal

Journal of Applied Physics

Journal Volume

v.68

Pages

28-8

Date Issued

1990

Date

1990

Author(s)

Lin, Sheng-Hsien

URI

Type

journal article