Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Communication Engineering / 電信工程學研究所
Investigation of electromagnetic interferences caused by the stacked I/O connectors
Details
Investigation of electromagnetic interferences caused by the stacked I/O connectors
Journal
IEEE Antennas and Propagation Society, AP-S International Symposium
Pages
1889-1892
Date Issued
2011
Author(s)
Chou, H.-H.
Tuan, S.-C.
Chou, H.-T.
Lee, Y.-S.
HSI-TSENG CHOU
DOI
10.1109/APS.2011.5996868
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-80054984182&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/365193
SDGs
[SDGs]SDG7
Type
conference paper
