The study of electrical characteristics of heterojunction based on ZnO nanowires using ultrahigh-vacuum conducting atomic force microscopy

Resource

Applied Physics Letters 91: 233105

Journal

Applied Physics Letters 91:

Journal Issue

233105

Pages

-

Date Issued

2007

Date

2007

Author(s)

He, J. H.

Ho, C. H.

URI

Type

journal article

File(s)

Name

03.pdf

Size

255.57 KB

Format

Adobe PDF

Checksum

(MD5):5b4ea9d2a3557ad079bc2d5be2c802c4