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College of Engineering / 工學院
Mechanical Engineering / 機械工程學系
High-sensitivity imaging with lateral resonance mode atomic force microscopy
Details
High-sensitivity imaging with lateral resonance mode atomic force microscopy
Journal
Nanoscale
Journal Volume
8
Journal Issue
43
Pages
18421-18427
Date Issued
2016
Author(s)
Ding, R.-F.
Yang, C.-W.
Huang, K.-Y.
Hwang, I.-S.
KUANG-YUH HUANG
DOI
10.1039/c6nr04151e
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/447731
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84994681144&doi=10.1039%2fc6nr04151e&partnerID=40&md5=1a26ae2061b8ba78b0bf02647e8bc21e
SDGs
[SDGs]SDG11
Type
journal article