Direct measurement of interfacial structure in epitaxial Gd 2O3 on GaAs (0 0 1) using scanning tunneling microscopy
Journal
Microelectronic Engineering
Journal Volume
88
Journal Issue
7
Pages
1058-1060
Date Issued
2011
Author(s)
Chiu, Y.P.
Shih, M.C.
Huang, B.C.
Shen, J.Y.
Huang, M.L.
Lee, W.C.
Chang, P.
Chiang, T.H.
Hong, M.
Type
conference paper