Performance prediction and function recovery of CMOS circuits damaged by Co-60 irradiation

Resource

Circuits, Devices and Systems, IEE Proceedings G

Journal

Circuits, Devices and Systems, IEE Proceedings G

Pages

-

Date Issued

1992-07

Date

1992-07

Author(s)

Chang-Liao, K.-S.

Hwu, J.-G.

DOI

0956-3768

URI

Type

journal article

File(s)

Name

00143328.pdf

Size

389.67 KB

Format

Adobe PDF

Checksum

(MD5):28bb8361a7510c52cbbd88a1dcbcd77f