Demonstration of edge roughness effect on the magnetization reversal of spin valve submicron wires

Journal

Applied Physics Letters

Journal Volume

97

Journal Issue

2

Date Issued

2010

Author(s)

Chiang, T.W.

Chang, L.J.

Yu, C.

Chen, D.C.

Yao, Y.D.

Lee, S.F.

DOI

10.1063/1.3463459

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-77955139044&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/356413

Type

journal article