Chap. 3: Logic and Fault Simulation

Journal

VLSI Test Principles and Architectures

Date Issued

2006-06

Author(s)

J.-L. Huang

James C.-M. Li

Duncan M. (Hank) Walker

JIUN-LANG HUANG

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/325749

Type

journal article