Interfacial trap characteristics in depletion mode GaAs MOSFETs

Journal

Journal of Crystal Growth

Journal Volume

301

Pages

1009-1012

Date Issued

2007

Author(s)

Lee, TC

Chan, CY

Tsai, PJ

Hsu, Shawn SH

Kwo, J

DOI

10.1016/j.jcrysgro.2006.11.244

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/331375

Type

journal article