Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Multi-Mode Automatic Test Pattern Generation for Dynamic Voltage and Frequency Scaling Designs
Details
Multi-Mode Automatic Test Pattern Generation for Dynamic Voltage and Frequency Scaling Designs
Journal
ITC
Date Issued
2012-01
Author(s)
CHIEN-MO LI
B. C. Bai
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/374349
Type
conference paper