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College of Engineering / 工學院
Mechanical Engineering / 機械工程學系
Carrier backscattering characteristics of nanoscale strained complementary metal-oxide-semiconductor devices featuring the optimal stress engineering
Details
Carrier backscattering characteristics of nanoscale strained complementary metal-oxide-semiconductor devices featuring the optimal stress engineering
Journal
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
Date Issued
2009
Author(s)
Shu-Tong Chang
Ming-Han Liao
Chang-Chun Lee
Jacky Huang
Bing-Fong Hsieh
MING-HAN LIAO
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/590727
Type
journal article