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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
A possible mechanism for improved light-induced degradation in deuterated amorphous-silicon alloy
Details
A possible mechanism for improved light-induced degradation in deuterated amorphous-silicon alloy
Journal
Applied Physics Letters
Journal Volume
71
Journal Issue
11
Pages
1498-1500
Date Issued
1997
Author(s)
Wei, J.-H.
Sun, M.-S.
SI-CHEN LEE
DOI
10.1063/1.119972
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/498750
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-0000237833&doi=10.1063%2f1.119972&partnerID=40&md5=50d73ed99f6d60619d8447926a47613c
SDGs
[SDGs]SDG7
Type
journal article