Nanoscale surface electrical properties of aluminum zinc oxide thin films investigated by scanning probe microscopy

Resource

J. of Appl. Phys.,104,114314-114314.

Journal

J. of Appl. Phys

Journal Issue

104

Pages

114314-114314

Date Issued

2008-05

Date

2008-05

Author(s)

Chen, S. H.

Yu, C. F.

Lin, Y. S.

Xie, W. J.

Hsu, T. W.

Tsai, D. P.

URI

http://ntur.lib.ntu.edu.tw//handle/246246/217764

File(s)

Name

904.pdf

Size

23.49 KB

Format

Adobe PDF

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