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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Quantum-well-width dependencies of postgrowth thermal annealing effects of InGaN/GaN quantum wells
Details
Quantum-well-width dependencies of postgrowth thermal annealing effects of InGaN/GaN quantum wells
Journal
Journal of Applied Physics
Journal Volume
93
Journal Issue
12
Pages
9693-9696
Date Issued
2003
Author(s)
CHIH-CHUNG YANG
DOI
10.1063/1.1576514
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-0038143264&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/302034
SDGs
[SDGs]SDG7
Type
journal article