Near-field Analysis of VCSELs after HTOL test
Journal
2022 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2022 - Proceedings
ISBN
9798350350012
Date Issued
2022-01-01
Author(s)
Abstract
Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms.
Type
conference paper