Charge confinement in silicon nanowires by surface functionalization

Journal

Technical Proceedings of the 2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011

Journal Volume

1

Pages

484-487

Date Issued

2011

Author(s)

Shih, Y.C.

Lee, J.H.

Lin, C.T.

Chen, C.S.

Wu, K.C.

URI

URL

Type

conference paper