High Resolution SIMS Imaging of Multilayer Deposited High-Tc Thin Films
Resource
Secondary Ion Mass Spectrometry:SIMS VII, p.693-696
Journal
Secondary Ion Mass Spectrometry:SIMS VII
Pages
693-696
Date Issued
1989
Date
1989
Author(s)
Wang, Yuh-Lin
Publisher
John Wiley & Sons;Sons
Type
conference paper