5位元10GS/s類比/數位轉換器-以0.18-μm CMOS製程製作
A 5-bit 10-GSample/s A/D Converter in 0.18-μm CMOS Technology
Date Issued
2006
Date
2006
Author(s)
Ding, Jian-Yu
DOI
en-US
Abstract
With the increasing use of digital computing and signal processing, the need of high-speed ADCs increases with time. Flash ADCs are still the architecture of choice, where maximum sampling rate and need no high resolution. For example, read-write channel of a disk drive systems, communication systems, microwave telescope array, and 10-GSamples/s microwave receiver are the cases.
A 5-b 10-GSample/s analog-to-digital converter incorporates distributed sampling and digital offset calibration techniques. The sampling is accomplished by current-mode flipflops, eliminating the input-dependent distortions. The offset is calibrated digitally with a resolution of 5 bits. Fabricated in 0.18-μm CMOS technology, this converter achieves differential and integral nonlinearities of 0.4 and 0.6 LSB, respectively, and 4.05 effective bits at a sampling rate of 10 GHz. The circuit consumes 560 mW from a 1.8-V supply and occupies an area of 1.58 mm × 1.11 mm including pads.
Subjects
類比/數位轉換器
分散式取樣
偏差校正
直接ADC-DAC測試
A/D converter
distributed sampling
offset calibration
direct ADC-DAC test.
Type
thesis
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