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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Defects probing by temperature dependence Raman scattering of GaAsSbN
Details
Defects probing by temperature dependence Raman scattering of GaAsSbN
Journal
IEDMS 2012, international electron devices and materials symposium
Pages
CO05
Date Issued
2012-12
Author(s)
J. Wu
Y. T. Lin
HAO-HSIUNG LIN
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/373905
Type
conference paper