Adaptive Lot/equipment Matching Strategy and GA based Approach for Optimized Dispatching and Scheduling in a Wafer Probe Center.
Journal
Proceedings of the 2004 IEEE International Conference on Robotics and Automation, ICRA 2004, April 26 - May 1, 2004, New Orleans, LA, USA
Pages
3125-3130
Date Issued
2004
Author(s)
Type
conference paper