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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Model-based proximity effect correction for helium ion beam lithography
Details
Model-based proximity effect correction for helium ion beam lithography
Journal
Advanced Lithography 2018 -- Proc. SPIE 10584 Novel Patterning Technologies 2018
Date Issued
2018
Author(s)
Chien-Lin Lee
Sheng-Wei Chien
Kuen-Yu Tsai*
KUEN-YU TSAI
DOI
10.1117/12.2297691
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429891
Type
conference paper