Fault Diagnosis and Spare Allocation for Yield Enhancement in Large Reconfigurable PLAs
Resource
IEEE Transactions on Computers, v.41 n.2, p.221-226
Journal
IEEE Transactions on Computers
Journal Volume
v.41 n.2
Pages
221-226
Date Issued
1992-07
Date
1992-07
Author(s)
Kuo, Sy-Yen
Type
journal article