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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Correlation between Si-H/D bond desorption and injected electron energy in metal-oxide-silicon tunneling diodes
Details
Correlation between Si-H/D bond desorption and injected electron energy in metal-oxide-silicon tunneling diodes
Journal
Applied Physics Letters
Journal Volume
78
Journal Issue
5
Pages
637-639
Date Issued
2001
Author(s)
CHEE-WEE LIU
Lin, C.-H.
Lee, M.H.
CHEE-WEE LIU
DOI
10.1063/1.1343477
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-0001546595&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/293629
SDGs
[SDGs]SDG7
Type
journal article
