Operation lifetimes of organic light-emitting devices with different layer structures
Resource
Chemical Physics Letters 402 (4-6): 335-339
Journal
Chemical Physics Letters
Journal Volume
402
Journal Issue
4-6
Pages
335 - 339
Date Issued
2005-02
Author(s)
Abstract
In this Letter, we present and analyze the operation lifetime behaviors of organic light-emitting devices by changing thicknesses of the hole-transport layer (HTL), the emitting layer (EML) and the electron transport layer (ETL). It is found that devices with higher power efficiency exhibit longer lifetimes. Given the same power efficiency, devices with a thicker HTL (or a thinner EML and ETL) have longer lifetimes. We also observe that, among different samples, the fixed charge density increasing rate near the HTL/EML interface is linearly correlated to the non-radiative center formation rate. © 2004 Elsevier B.V. All rights reserved.
SDGs
Other Subjects
Correlation methods; Interfaces (materials); Thickness measurement; Electron transport layer (ETL); Emitting layer (EL); Hole-transport layer (HTL); Organic light emitting diodes; Light emitting diodes; article; correlation analysis; density; electricity; electron transport; light emitting diode; mathematical computing; thickness
Type
journal article