Raman scattering studies for chemical vapor deposited 3C-SiC films on (100) Si

Resource

J. Appl. Phys.,64,3176-3186.

Journal

J. Appl. Phys

Journal Issue

64

Pages

3176-3186

Date Issued

1988-01

Date

1988-01

Author(s)

Feng, Z.C.

Mascarenhas, A.

Choyke &amp, W.J.

Powell, J.A.

URI

Type

journal article