Investigation of frequency/thickness dependent configurable dielectric properties on P(VDF-TrFE-CTFE)-MIS structures

Journal

Proceedings - International NanoElectronics Conference, INEC

Journal Volume

2016-October

Date Issued

2016

Author(s)

Chen, P.-H.

Wang, I.-S.

Hsueh, H.-T.

DOI

10.1109/INEC.2016.7589273

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/499152

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84992756805&doi=10.1109%2fINEC.2016.7589273&partnerID=40&md5=5dd9992dbfea4885603b107d81df3ec7

Type

conference paper