Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Interfacial reactions and electromigration in flip-chip solder joints
Details
Interfacial reactions and electromigration in flip-chip solder joints
Journal
Advanced Flip Chip Packaging
Pages
503-560
ISBN
9781441957689
1441957677
9781441957672
Date Issued
2013
Author(s)
Ho C.E.
Kao C.R.
Tu K.N.
C. ROBERT KAO
DOI
10.1007/978-1-4419-5768-9_11
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84907657767&doi=10.1007%2f978-1-4419-5768-9_11&partnerID=40&md5=7bcb80a7a4ccb7cd1fa05380c971fda7
https://scholars.lib.ntu.edu.tw/handle/123456789/432624
SDGs
[SDGs]SDG10
Publisher
Springer US
Type
book part