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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects
Details
Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects
Journal
VLSI/CAD
Date Issued
2012-01
Author(s)
CHIEN-MO LI
EH Ma
WE Wei
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/374353
Type
conference paper