Partially prizm-gridded FDTD analysis for layered structures of transversely curved boundary
Journal
1998 IEEE MTT-S International Microwave Symposium
Pages
1417-1420
Date Issued
1998-06
Author(s)
C. T. Hwang
Abstract
A partially prism-gridded FDTD analysis is presented to deal with layered structures with curved boundary in transverse directions. It is applied to calculate the scattering parameters of vias in multilayer packaging. The good agreement of the results with those by other methods verifies the accuracy of this analysis.
Type
conference paper