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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing
Details
Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing
Journal
IEEE International Test Conference
Date Issued
2014-01
Author(s)
CHIEN-MO LI
B.C. Bai
C.A. Chen
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/388867
Type
conference paper