Built-In Self-Test and Self-Repair Techniques for TFT Array
Date Issued
2007
Date
2007
Author(s)
Lin, Chen-Wei
DOI
en-US
Abstract
TFT array is a matrix-like structure which contains thousands to millions pixels to display information. However to it’s difficult to make sure that the TFT panel manufactured is no-defect which means all the pixels are well and all the metal wires are continuous. Therefore it’s necessary to test the array including the wires and the pixels. For testing the TFT array, large probes number of ATE and long testing time are needed traditionally. To improve this, this thesis proposed two built-in self-test techniques for testing the pixels and the scan/data line respectively. Both the technique can also be applied into SoG (System on Glass) concept.
Subjects
薄膜電晶體陣列
內建式自我測試
電荷感測
內建式自我修復
TFT array
built-in self-test
charge sensing
built-in self-repair
Type
thesis
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ntu-96-R94943164-1.pdf
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