Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
Journal
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
636
Journal Issue
1 SUPPL.
Pages
S83-S89
Date Issued
2011
Author(s)
Hara, K.
Affolder, A.A.
Allport, P.P.
Bates, R.
Betancourt, C.
Bohm, J.
Brown, H.
Buttar, C.
Carter, J.R.
Casse, G.
Chen, H.
Chilingarov, A.
Cindro, V.
Clark, A.
Dawson, N.
Dewilde, B.
Doherty, F.
Dolezal, Z.
Eklund, L.
Fadeyev, V.
Ferrere, D.
Fox, H.
French, R.
Garc?a, C.
Gerling, M.
Gonzalez Sevilla, S.
Gorelov, I.
Greenall, A.
Grillo, A.A.
Hamasaki, N.
Hatano, H.
Hoeferkamp, M.
Hommels, L.B.A.
Ikegami, Y.
Jakobs, K.
Kierstead, J.
Kodys, P.
Köhler M.
Kohriki, T.
Kramberger, G.
Lacasta, C.
Li, Z.
Lindgren, S.
Lynn, D.
Maddock, P.
Mandi?, I.
Martinez-Mckinney, F.
Mart? I Garcia, S.
Maunu, R.
McCarthy, R.
Metcalfe, J.
Mikestikova, M.
Miku?, M.
Mi?ano, M.
Mitsui, S.
O'Shea, V.
Parzefall, U.
Sadrozinski, H.F.-W.
Schamberger, D.
Seiden, A.
Terada, S.
Robinson, D.
Puldon, D.
Sattari, S.
Seidel, S.
Takahashi, Y.
Toms, K.
Tsionou, D.
Unno, Y.
Von Wilpert, J.
Wormald, M.
Wright, J.
Type
conference paper