A three-port vector network analyzer - measurement system, calibration and results
Resource
Microwave Symposium Digest, 2001 IEEE MTT-S International
Journal
Microwave Symposium Digest, 2001 IEEE MTT-S International
Pages
-
Date Issued
2001-05
Date
2001-05
Author(s)
Deng, Wei-Kung
DOI
N/A
Abstract
In this paper a practical three-port vector network analyzer (TVNA) measurement system with its calibration procedures, and results are presented. With this TVNA, the three-port device scattering matrix can be directly measured by using a test fixture or a probe station. It can then reduce the repeatability problem occurred in the use of conventional two-port vector network analyzer by connecting and disconnecting matched load at the different ports of a three-port device. The three-port TRL and LRM calibration procedures are developed and verified with the coaxial circuits. In addition, a three-port SOLR calibration procedure is developed for on-wafer measurement of a three-port MMIC with three orthogonal-oriented pads.
SDGs
Type
journal article
File(s)![Thumbnail Image]()
Loading...
Name
00967194.pdf
Size
250.53 KB
Format
Adobe PDF
Checksum
(MD5):24bc707afba0ef48c95c8ea18b778978