Improving boolean circuit testing by using quantum search

Journal

2008 8th IEEE Conference on Nanotechnology, IEEE-NANO

Pages

617-620

Date Issued

2008

Author(s)

Chou, Y.-H.

DOI

10.1109/NANO.2008.185

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500936

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-55349100545&doi=10.1109%2fNANO.2008.185&partnerID=40&md5=72a94dc87390e93383392762286d6bd2

Type

conference paper