Improving boolean circuit testing by using quantum search
Journal
2008 8th IEEE Conference on Nanotechnology, IEEE-NANO
Pages
617-620
Date Issued
2008
Author(s)
Chou, Y.-H.
Abstract
Given any classical circuit, a minimum input quantum version of boolean circuit can be constructed with general CCN gates. Any quantum boolean circuit can be easily tested with one test pattern under stuck-at fault model. In this paper, we apply quantum search algorithm to boolean logic testing problem and drastically decrease not only the number of test patterns but also the time and the number of bits we needed to find out the faulty wires.
Type
conference paper