Diagnosis of Single stuck-at Faults and Multiple Timing Faults in Scan Chains

Resource

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (6): 708-718

Journal

IEEE Transactions on

Journal Volume

Very

Journal Issue

6

Pages

708-718

Date Issued

2005

Date

2005

Author(s)

Li, James Chien-Mo

URI

Type

journal article

File(s)

Name

04.pdf

Size

485.74 KB

Format

Adobe PDF

Checksum

(MD5):76257d32df0a4a2eab5c483d0f288163