Test time reduction in scan designed circuits

Resource

Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on

Journal

Design Automation

Pages

-

Date Issued

1993-02

Date

1993-02

Author(s)

Lai, Wen-Joung

Kung, Chen-Pin

Lin, Chen-Shang

DOI

DOI

N/A

URI

Type

journal article

File(s)

Name

00386427.pdf

Size

498.8 KB

Format

Adobe PDF

Checksum

(MD5):9ff0907af8cc7d35706e124c07cae650