PSBIST: A Partial-Scan Based Built-In Self-Test Scheme.
Journal
Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993
Pages
507-516
Date Issued
1993
Author(s)
Abstract
Partial-scan based built-in self-test (PSBIST) is a versatile design for testability (DFT) scheme, which employs pseudo-random BIST at all levels of test to achieve fault coverages greater than 98% on average, and supports deterministic partial scan at the IC level to achieve nearly 100% fault coverage. While PSBIST provides all the benefits of BIST, it incurs less area overhead and performance degradation than full scan. The area overhead is further reduced when the boundary scan cells are reconfigured for BIST usage.>
Type
conference paper