PSBIST: A Partial-Scan Based Built-In Self-Test Scheme.

Journal

Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993

Pages

507-516

Date Issued

1993

Author(s)

Lin, Chih-Jen

Zorian, Yervant

Bhawmik, Sudipta

DOI

URI

URL

Type

conference paper