Investigation of GaN Fin-HEMTs with micron-scale fin width

Journal

Proceedings of SPIE - The International Society for Optical Engineering

Journal Volume

10104

Date Issued

2017

Author(s)

Chang, L.-C.

Yang, M.

Jiang, Y.-H.

DOI

10.1117/12.2257211

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505948

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85017031041&doi=10.1117%2f12.2257211&partnerID=40&md5=aa12ff4b0969ef77fb4a7e4d76042a9c

Type

conference paper