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Measurements of the near-field intensity gradients using a tapping-mode near-field scanning optical microscope
Resource
Proceedings of the second Asia-Pacific Workshop on Near-field Optics, Beijing, China(1999)
Journal
Proceedings of the second Asia-Pacific Workshop on Near-field Optics, Beijing
Pages
-
Date Issued
1999
Date
1999
Author(s)
Lin, W. C.
Huang, H. J.
Yang, C. W.
Ho, F. H.
Lin, W. Y.
Tsai, D. P.
Type
conference paper